Keithley Hosts Capacitance-Voltage Testing Webinar Keithley Instruments will host a 45min online seminar entitled 'Semiconductor Capacitance-Voltage (C-V) Testing Fundamentals'. The seminar will be broadcast on 29 October at 15:00 CET, to enable engineers based in Europe to participate in the live event. The webcast is free to attend, but registration is required. The seminar will introduce the topic of C-V measurements as they relate to semiconductor device and materials characterisation. It is recommended for engineers who are new to semiconductor materials and device testing and those that want to refresh their knowledge of the subject.
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Ultrasonics Testing System Has USB Interface The USLT 2000 ultrasonic testing system from GE Sensing And Inspection Technologies is now supplied with a USB interface. This replaces the former PCMCIA card interface and will ensure universal connectivity with standard PCs. The modification will allow users, especially those carrying out spot-weld checks in the automotive sector, to achieve easier connectivity between USLT 2000 ultrasonic equipment and standard PC notebooks. The USLT 2000 is an ultrasonic dialogue instrument that has been specially developed for testing the variety of welds, bondings and solders used in the automotive industry. It features purpose-designed software to provide universal evaluation options for detected indications to meet both national and international test specifications. It also offers high-resolution display of results for rapid sentencing. Inspectors in the automotive sector are increasingly using notebooks without a PCMCIA interface, which has n...